InZiv, based in Israel, provides testing and inspection tools for the display industry, including ones for QD displays.
InZiv technology offers both full wafer and localized individual pixel inspection at high resolution. The system uses AOI, PL and EL to provide the most critical measurements for todayâ€™s display testing needs, including EQE and angular measurements.
InZiv integrates multiple inspection modalities in one system, and provides a comprehensive analysis of both the whole wafer and its sub-pixel features. The unique combination empowers QD display developers with the ability to better understand the relationship between light, color, voltage, and structure â€“ directly addressing todayâ€™s most critical challenges in quantum dots based displays.
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